• dual-crystal-straight-probe-5mhz-6mm-f100
  • alt="5MHz Dual Crystal Probe for Steel Pipe Thickness Measurement"
  • Dual Crystal Straight Probe 5MHz Φ6mm F100 | Richeng NDT
  • dual-crystal-straight-probe-5mhz-6mm-f100
  • alt="5MHz Dual Crystal Probe for Steel Pipe Thickness Measurement"
  • Dual Crystal Straight Probe 5MHz Φ6mm F100 | Richeng NDT

Dual Crystal Straight Probe 5MHz Φ6mm F100 | Richeng NDT

Industrial-grade 5MHz dual element straight probe with Φ6mm crystal and 100mm focus. Ideal for corrosion and thickness measurement in steel pipes. OEM/ODM service available.
  • dual-crystal-straight-probe-5mhz-6mm-f100
  • alt="5MHz Dual Crystal Probe for Steel Pipe Thickness Measurement"
  • Dual Crystal Straight Probe 5MHz Φ6mm F100 | Richeng NDT

Description

5MHz Φ6mm F100 Dual Crystal Straight Contact Probe

Type: Double crystal straight probe. Compared with single crystal probes, it has two built-in chips for transmission and reception, eliminating near surface blind spots, making it particularly suitable for measuring thin workpieces and corrosion monitoring.
Frequency: 5 MHz. A good balance has been achieved between detection sensitivity and penetration power, making it suitable for detecting thinner workpieces or near surface defects.
Size: Φ 6 mm. The probe chip diameter is 6mm, suitable for detecting workpieces with small curvature or limited space.
Focal length: F100. The probe is focused at 100mm and has the highest sensitivity for defect detection near that depth.
Interface/Model: The DNXS, DNS, DNM, and DNL on the label are likely codes for different interface types or cable configurations, and should be clearly labeled in the product parameters.

Parameter Specification
Product Type Dual Crystal Straight Probe
Nominal Frequency 1/2.5/5
chip size  6/10/14/20
focal length 5/10/15/20/25/30
interface type C6/C5

5. Application scenarios
Measurement of wall thickness of steel pipes and plates
Corrosion thinning monitoring
Testing of castings, forgings, and coarse-grained materials
Thin walled workpieces and near surface defect detection